Concept information
Preferred term
SIMS
Definition
- Secondary Ion Mass Spectrometers (SIMS) are mass spectrometric techniques that are useful for the identification of polymer surfaces and fiber/polymer interfaces by the detection of ionic group clusters that are characteristic of specific polymers. (en)
Broader concept
URI
https://gcmd.earthdata.nasa.gov/kms/concept/dc965068-fe7b-42bd-84cf-9b251b2397ea
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